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Search for "tilt estimation" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.
Determining amplitude and tilt of a lateral force microscopy sensor
Beilstein J. Nanotechnol. 2021, 12, 517–524, doi:10.3762/bjnano.12.42
- for a given amplitude and tilt. Finally, the amplitude and tilt are determined by fitting the simulation output to the data with oscillation. Keywords: frequency-modulation atomic force microscopy; lateral force microscopy; amplitude calibration; tilt estimation; Introduction Frequency-modulation
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